![EVAL_DCP_01 - Dynamic Characterization Platform - SiC Applications Support](/~/media/technical-resources/technicalcenters/dcp-board.jpg?h=338&w=460&la=en)
Product Number: EVAL_DCP_01
Application Note
The Dynamic Characterization Platform is designed to:
- Measure
- MOSFET switching losses, switching times, and gate charge accurately
- Schottky Barrier Diode (SBD) and body diode reverse recovery accurately
- Provide an informed reference design for gate drive and power loop PCB layout
- Provide informed recommendations for gate drive layout and components
- Promote streamlined device validation and quicker design cycles